Optimization of resonant dielectric multilayer for enhanced fluorescence imaging

Аннотация

In the aim of improving the sensitivity in objective-based total internal reflection fluorescence microscopy (ob-TIRF-M), we recently investigated the use of resonant dielectric multilayer (DM) coated coverslips while considering the experimental constraints of commercial ob-TIRF-M. The imaginary part of the refractive index 𝑘 of the DM top layer material was then shown to be a key parameter to control during the DM optimization in order to limit the discrepancies between theory and experiment.